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Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

PaperCitations, authors & open-access status

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 126 citations, 2010 year and closed oa status.

126
Citations
2010
Year
closed
OA Status

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