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Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

PaperCitations, authors & open-access status

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress have?

ScholarIQcitation count

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress has 126 citations in the OpenAlex counts ScholarIQ stores.

When was Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress published?

ScholarIQyear

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress has 2010 year in the ScholarIQ index.

What is the open-access status of Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress?

ScholarIQoa status

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress has closed oa status in the ScholarIQ index.

What is the DOI of Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress?

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The DOI for Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress is on the source record.

What is the OpenAlex record for Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress?

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The OpenAlex for Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress is on the source record.

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