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Shih-Ching Chen

ResearcherPublications, citations & collaboration network

Shih-Ching Chen is a researcher indexed in ScholarIQ from OpenAlex & ORCID. ScholarIQ records 167 works, 3,848 citations, an h-index of 33 and an i10-index of 86.

167
Works
3,848
Citations
33
h-index
86
i10-index

How has Shih-Ching Chen's publication output changed over time?

ScholarIQpublication output · 2005–2020

Output grew0% over the shown period — from 1 works in 2005 to 1 in 2020.

1
1
1
6
1
1
200520062009201020122020

What are the most-cited papers on Shih-Ching Chen?

ScholarIQmost cited works
Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films
Min-Chen Chen, Ting‐Chang Chang, Chih-Tsung Tsai, Sheng-Yao Huang, Shih-Ching Chen, Chih‐Wei Hu, Simon M. Sze, Ming‐Jinn Tsai
S105243760. 2010191 Citations
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Te-Chih Chen, Ting‐Chang Chang, Chih-Tsung Tsai, Tien‐Yu Hsieh, Shih-Ching Chen, Chia-Sheng Lin, Ming‐Chin Hung, Chun‐Hao Tu, Jiun‐Jye Chang, Po-Lun Chen
S105243760. 2010184 Citations
Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor
Chih-Tsung Tsai, Ting‐Chang Chang, Shih-Ching Chen, Ikai Lo, Shu-Wei Tsao, Ming‐Chin Hung, Jiun‐Jye Chang, Chen-Yi Wu, Chun‐Yao Huang
S105243760. 2010171 Citations
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
Yi‐Chun Chen, Ting‐Chang Chang, Hung-Wei Li, Shih-Ching Chen, Jin Lu, Wan-Fang Chung, Ya‐Hsiang Tai, Tseung‐Yuen Tseng
S105243760. 2010126 Citations

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Taipei Medical University Hospital
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Effects of an irregular bedtime schedule on sleep quality, daytime sleepiness, and fatigue among university students in Taiwan
Paper
Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films
Paper
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Paper
Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor
Paper
Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress
Paper
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