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Electrical Losses in Semiconductor Devices during Control of the Processes

PaperCitations, authors & open-access status

Electrical Losses in Semiconductor Devices during Control of the Processes is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Electrical Losses in Semiconductor Devices during Control of the Processes have?

ScholarIQcitation count

Electrical Losses in Semiconductor Devices during Control of the Processes has 6 citations in the OpenAlex counts ScholarIQ stores.

When was Electrical Losses in Semiconductor Devices during Control of the Processes published?

ScholarIQyear

Electrical Losses in Semiconductor Devices during Control of the Processes has 2018 year in the ScholarIQ index.

What is the open-access status of Electrical Losses in Semiconductor Devices during Control of the Processes?

ScholarIQoa status

Electrical Losses in Semiconductor Devices during Control of the Processes has closed oa status in the ScholarIQ index.

What is the DOI of Electrical Losses in Semiconductor Devices during Control of the Processes?

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The DOI for Electrical Losses in Semiconductor Devices during Control of the Processes is on the source record.

What is the OpenAlex record for Electrical Losses in Semiconductor Devices during Control of the Processes?

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The OpenAlex for Electrical Losses in Semiconductor Devices during Control of the Processes is on the source record.

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