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Formation and growth of interfacial intermetallics in Sn-0.3Ag-0.7Cu-xCeO2/Cu solder joints during the reflow process

PaperCitations, authors & open-access status

Formation and growth of interfacial intermetallics in Sn-0.3Ag-0.7Cu-xCeO2/Cu solder joints during the reflow process is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 43 citations, 2018 year and closed oa status.

43
Citations
2018
Year
closed
OA Status

Related on ScholarIQ

Chaojun Hou
Author
Jiajun Zhuang
Author
Electronic Packaging and Soldering Technologies
Topic
Electronic Packaging and Soldering Technologies
Topic
Intermetallics and Advanced Alloy Properties
Topic
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