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Infrared Characterization of Interfacial Si−O Bond Formation on Silanized Flat SiO<sub>2</sub>/Si Surfaces
PaperCitations, authors & open-access status
Infrared Characterization of Interfacial Si−O Bond Formation on Silanized Flat SiO<sub>2</sub>/Si Surfaces is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 181 citations, 2010 year and closed oa status.
181
Citations
2010
Year
closed
OA Status