ScholarIQanswers from OpenAlex
Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing
PaperCitations, authors & open-access status
Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing is a paper indexed in ScholarIQ from OpenAlex.
How many citations does Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing have?
ScholarIQcitation count
Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing has 6 citations in the OpenAlex counts ScholarIQ stores.
When was Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing published?
ScholarIQyear
Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing has 2018 year in the ScholarIQ index.
What is the open-access status of Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing?
ScholarIQoa status
Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing has closed oa status in the ScholarIQ index.
What is the DOI of Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing?
ScholarIQdoi
The DOI for Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing is on the source record.
What is the OpenAlex record for Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing?
ScholarIQopenalex
The OpenAlex for Measurement of Plating Thickness with High Liftoff Using Eddy Current Testing is on the source record.