Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon
Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon is a paper indexed in ScholarIQ from OpenAlex.
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Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon has 35 citations in the OpenAlex counts ScholarIQ stores.
When was Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon published?
Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon has 2015 year in the ScholarIQ index.
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Microscratch testing method for systematic evaluation of the adhesion of atomic layer deposited thin films on silicon has bronze oa status in the ScholarIQ index.
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