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OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations

PaperCitations, authors & open-access status

OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 7 citations, 2014 year and closed oa status.

7
Citations
2014
Year
closed
OA Status

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