OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations

OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations is a paper indexed in ScholarIQ from OpenAlex.

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OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations has 7 citations in the OpenAlex counts ScholarIQ stores.

When was OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations published?

OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations has 2014 year in the ScholarIQ index.

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OFETs with sub-100nm channel length fabricated by wafer-scale NIL and comprehensive DC and AC characterizations has closed oa status in the ScholarIQ index.

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