Scholar IQ
Try ScholarIQ free
Upload Records Snowball Search Search OpenAlex
About the database
ScholarIQanswers from OpenAlex

Quality and exposure control in semiconductor manufacturing. Part I: Modelling

PaperCitations, authors & open-access status

Quality and exposure control in semiconductor manufacturing. Part I: Modelling is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 20 citations, 2011 year and closed oa status.

20
Citations
2011
Year
closed
OA Status

Related on ScholarIQ

Michel Tollenaere
Author
International Journal of Production Research
Journal
Manufacturing Process and Optimization
Topic
Manufacturing Process and Optimization
Topic
Advanced Statistical Process Monitoring
Topic
Flexible and Reconfigurable Manufacturing Systems
Topic
470M+ articles · free account