ScholarIQanswers from OpenAlex
Review of Wafer Surface Defect Detection Methods
PaperCitations, authors & open-access status
Review of Wafer Surface Defect Detection Methods is a paper indexed in ScholarIQ from OpenAlex.
How many citations does Review of Wafer Surface Defect Detection Methods have?
ScholarIQcitation count
Review of Wafer Surface Defect Detection Methods has 74 citations in the OpenAlex counts ScholarIQ stores.
When was Review of Wafer Surface Defect Detection Methods published?
ScholarIQyear
Review of Wafer Surface Defect Detection Methods has 2023 year in the ScholarIQ index.
What is the open-access status of Review of Wafer Surface Defect Detection Methods?
ScholarIQoa status
Review of Wafer Surface Defect Detection Methods has gold oa status in the ScholarIQ index.
What is the DOI of Review of Wafer Surface Defect Detection Methods?
ScholarIQdoi
The DOI for Review of Wafer Surface Defect Detection Methods is on the source record.
What is the OpenAlex record for Review of Wafer Surface Defect Detection Methods?
ScholarIQopenalex
The OpenAlex for Review of Wafer Surface Defect Detection Methods is on the source record.