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The negative capacitance effect on the C-V measurement of ultra thin gate dielectrics induced by the stray capacitance of the measurement system
PaperCitations, authors & open-access status
The negative capacitance effect on the C-V measurement of ultra thin gate dielectrics induced by the stray capacitance of the measurement system is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 26 citations, 2003 year and closed oa status.
26
Citations
2003
Year
closed
OA Status