Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 have?

Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 has 13 citations in the OpenAlex counts ScholarIQ stores.

When was Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 published?

Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 has 2023 year in the ScholarIQ index.

What is the open-access status of Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101?

Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 has closed oa status in the ScholarIQ index.

What is the DOI of Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101?

The DOI for Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 is on the source record.

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The OpenAlex for Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 is on the source record.