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Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101
PaperCitations, authors & open-access status
Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101 is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 13 citations, 2023 year and closed oa status.
13
Citations
2023
Year
closed
OA Status
Related on ScholarIQ
Rajat Amat
Author
International Journal of Systems Assurance Engineering and Management
Journal
Industrial Vision Systems and Defect Detection
Topic
Industrial Vision Systems and Defect Detection
Topic
Advanced Machining and Optimization Techniques
Topic
Integrated Circuits and Semiconductor Failure Analysis
Topic