Upload Records Snowball Search Search OpenAlex
About the database ScholarIQanswers from OpenAlex
X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface
PaperCitations, authors & open-access status
X-ray diffraction evidence for epitaxial microcrystallinity in thermally oxidized SiO<sub>2</sub>thin films on the Si(001) surface is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 52 citations, 1993 year and closed oa status.
52
Citations
1993
Year
closed
OA Status