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Dhruv Patel

ResearcherPublications, citations & collaboration network

Dhruv Patel is a researcher indexed in ScholarIQ from OpenAlex & ORCID. ScholarIQ records 60 works, 570 citations, an h-index of 12 and an i10-index of 12.

60
Works
570
Citations
12
h-index
12
i10-index

How has Dhruv Patel's publication output changed over time?

ScholarIQpublication output · 2016–2025

Output grew0% over the shown period — from 1 works in 2016 to 1 in 2025.

1
1
1
2
1
4
1
2016201920202021202220232025

What are the most-cited papers on Dhruv Patel?

ScholarIQmost cited works
Machine learning based predictors for COVID-19 disease severity
Dhruv Patel, Vikram Kher, Bhushan Desai, Xiaomeng Lei, Steven Cen, Neha Nanda, Ali Gholamrezanezhad, Vinay Duddalwar, Bino Varghese, Assad A. Oberai
Scientific Reports. 202195 CitationsOPEN ACCESS
GDIP: Gated Differentiable Image Processing for Object Detection in Adverse Conditions
Sanket Kalwar, Dhruv Patel, Aakash Aanegola, Krishna Reddy Konda, Sourav Garg, K. Madhava Krishna
202384 Citations
Solution of physics-based Bayesian inverse problems with deep generative priors
Dhruv Patel, Deep Ray, Assad A. Oberai
S40006715. 202258 CitationsOPEN ACCESS
Circumventing the solution of inverse problems in mechanics through deep learning: Application to elasticity imaging
Dhruv Patel, Raghav Tibrewala, Adriana Vega, Li Dong, Nicholas Hugenberg, Assad A. Oberai
S40006715. 201952 Citations
Deep learning-based detection, classification, and localization of defects in semiconductor processes
Dhruv Patel, Ravi Bonam, Assad A. Oberai
Journal of Micro/Nanolithography MEMS and MOEMS. 202025 Citations

Related on ScholarIQ

Georgia Institute of Technology
Institution
Machine learning based predictors for COVID-19 disease severity
Paper
GDIP: Gated Differentiable Image Processing for Object Detection in Adverse Conditions
Paper
Solution of physics-based Bayesian inverse problems with deep generative priors
Paper
Circumventing the solution of inverse problems in mechanics through deep learning: Application to elasticity imaging
Paper
Deep learning-based detection, classification, and localization of defects in semiconductor processes
Paper
470M+ articles · free account