Deep learning-based detection, classification, and localization of defects in semiconductor processes

Deep learning-based detection, classification, and localization of defects in semiconductor processes is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Deep learning-based detection, classification, and localization of defects in semiconductor processes have?

Deep learning-based detection, classification, and localization of defects in semiconductor processes has 25 citations in the OpenAlex counts ScholarIQ stores.

When was Deep learning-based detection, classification, and localization of defects in semiconductor processes published?

Deep learning-based detection, classification, and localization of defects in semiconductor processes has 2020 year in the ScholarIQ index.

What is the open-access status of Deep learning-based detection, classification, and localization of defects in semiconductor processes?

Deep learning-based detection, classification, and localization of defects in semiconductor processes has closed oa status in the ScholarIQ index.

What is the DOI of Deep learning-based detection, classification, and localization of defects in semiconductor processes?

The DOI for Deep learning-based detection, classification, and localization of defects in semiconductor processes is on the source record.

What is the OpenAlex record for Deep learning-based detection, classification, and localization of defects in semiconductor processes?

The OpenAlex for Deep learning-based detection, classification, and localization of defects in semiconductor processes is on the source record.