ScholarIQanswers from OpenAlex
IEEE Transactions on Device and Materials Reliability
JournalCitation impact & published research
IEEE Transactions on Device and Materials Reliability is a journal indexed in ScholarIQ from OpenAlex.
What is the OpenAlex record for IEEE Transactions on Device and Materials Reliability?
ScholarIQopenalex
The OpenAlex for IEEE Transactions on Device and Materials Reliability is on the source record.
What are the most-cited papers on IEEE Transactions on Device and Materials Reliability?
ScholarIQmost cited works
A Highly Reliable Memory Cell Design Combined With Layout-Level Approach to Tolerant Single-Event Upsets
Chunhua Qi, Liyi Xiao, Tianqi Wang, Jie Li, Linzhe Li
An Improved Thermal Network Model of the IGBT Module for Wind Power Converters Considering the Effects of Base-Plate Solder Fatigue
Hui Li, Yaogang Hu, Shengquan Liu, Li Yang, Xinglin Liao, Zhixiang Liu