Microelectronics Reliability

JournalCitation impact & published research

Microelectronics Reliability is a journal indexed in ScholarIQ from OpenAlex. ScholarIQ records 31,060 works, 203,210 citations, an h-index of 132 and an APC (USD) of 2,190.

31,060

Works

203,210

Citations

132

h-index

2,190

APC (USD)

IDs:OpenAlex

What are the most-cited papers on Microelectronics Reliability?

ScholarIQmost cited works

Remaining useful life prediction of aviation circular electrical connectors using vibration-induced physical model and particle filtering method

Bo Sun, Yu Li, Zili Wang, Yi Ren, Qiang Feng, Dezhen Yang, Mingsheng Lü, Xueyong Chen

Microelectronics Reliability. 201847 Citations

Two phase cooling with nano-fluid for highly dense electronic systems-on-chip – A pilot study

B. R. Ramesh Bapu, S. Kayalvizhi, S. Murugavalli

Microelectronics Reliability. 202020 Citations

Stress factors in aircraft electronics: Superimpositions, case studies and failure precautions

P. Jacob, G. Nicoletti

Microelectronics Reliability. 20190 Citations

Related on ScholarIQ

Remaining useful life prediction of aviation circular electrical connectors using vibration-induced physical model and particle filtering method

Paper

Two phase cooling with nano-fluid for highly dense electronic systems-on-chip – A pilot study

Paper

Stress factors in aircraft electronics: Superimpositions, case studies and failure precautions

Paper

Semiconductor materials and devices

Topic

Integrated Circuits and Semiconductor Failure Analysis

Topic

Advancements in Semiconductor Devices and Circuit Design

Topic