Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress
Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress is a paper indexed in ScholarIQ from OpenAlex.
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Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress has 184 citations in the OpenAlex counts ScholarIQ stores.
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Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress has 2010 year in the ScholarIQ index.
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