Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class have?

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class has 297 citations in the OpenAlex counts ScholarIQ stores.

When was Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class published?

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class has 2019 year in the ScholarIQ index.

What is the open-access status of Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class?

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class has closed oa status in the ScholarIQ index.

What is the DOI of Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class?

The DOI for Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class is on the source record.

What is the OpenAlex record for Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class?

The OpenAlex for Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class is on the source record.