Upload Records Snowball Search Search OpenAlex
About the database ScholarIQanswers from OpenAlex
Gamma-ray-irradiation effects on the leakage current and reliability of sputtered TiO2 gate oxide in metal–oxide–semiconductor capacitors
PaperCitations, authors & open-access status
Gamma-ray-irradiation effects on the leakage current and reliability of sputtered TiO2 gate oxide in metal–oxide–semiconductor capacitors is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 39 citations, 2002 year and closed oa status.
39
Citations
2002
Year
closed
OA Status