Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing is a paper indexed in ScholarIQ from OpenAlex.
How many citations does Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing have?
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has 27 citations in the OpenAlex counts ScholarIQ stores.
When was Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing published?
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has 2014 year in the ScholarIQ index.
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Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing has closed oa status in the ScholarIQ index.
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