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Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
PaperCitations, authors & open-access status
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 27 citations, 2014 year and closed oa status.
27
Citations
2014
Year
closed
OA Status