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Wafer Defect Identification with Optimal Hyper-Parameter Tuning of Support Vector Machine using the Deep Feature of ResNet 101
PaperCitations, authors & open-access status
Wafer Defect Identification with Optimal Hyper-Parameter Tuning of Support Vector Machine using the Deep Feature of ResNet 101 is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 6 citations, 2023 year and diamond oa status.
6
Citations
2023
Year
diamond
OA Status