ScholarIQanswers from OpenAlex
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films
PaperCitations, authors & open-access status
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films is a paper indexed in ScholarIQ from OpenAlex.
How many citations does Wake-up effects in Si-doped hafnium oxide ferroelectric thin films have?
ScholarIQcitation count
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films has 401 citations in the OpenAlex counts ScholarIQ stores.
When was Wake-up effects in Si-doped hafnium oxide ferroelectric thin films published?
ScholarIQyear
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films has 2013 year in the ScholarIQ index.
What is the open-access status of Wake-up effects in Si-doped hafnium oxide ferroelectric thin films?
ScholarIQoa status
Wake-up effects in Si-doped hafnium oxide ferroelectric thin films has closed oa status in the ScholarIQ index.
What is the DOI of Wake-up effects in Si-doped hafnium oxide ferroelectric thin films?
ScholarIQdoi
The DOI for Wake-up effects in Si-doped hafnium oxide ferroelectric thin films is on the source record.
What is the OpenAlex record for Wake-up effects in Si-doped hafnium oxide ferroelectric thin films?
ScholarIQopenalex
The OpenAlex for Wake-up effects in Si-doped hafnium oxide ferroelectric thin films is on the source record.