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Virtual metrology models for predicting avera PECVD oxide film thickne

PaperCitations, authors & open-access status

Virtual metrology models for predicting avera PECVD oxide film thickne is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 10 citations, 2011 year and closed oa status.

10
Citations
2011
Year
closed
OA Status

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